The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Jan. 15, 2008
Kazuhiko Hirata, Chiyoda-ku, JP;
Tatsuo Yajima, Chiyoda-ku, JP;
Yoshiyuki Sonda, Chiyoda-ku, JP;
Asahi Glass Company, Limited, Tokyo, JP;
Abstract
Shape inspection is carried out without preparing an inspection apparatus for each model of product. There is provided a shape inspection method comprising a first step of placing an object to be measured on an inspection stand for actual measurement, a second step of obtaining information of the surface shape of the object, a third step of calculating shape data of the object in a weightless state based on the information of the surface shape of the object, and a fourth step of recalculating the shape data of the object in a state that the object is placed on a predetermined inspection stand based on the shape data in the weightless state of the object, and judging the quality of the object based on the recalculated shape data of the object.