Tsuchiura, Japan

Yoshiyuki Nagano

This inventor holds 6 USPTO granted patents and 2 published patent applications. Top assignees: Hitachi Construction Machinery Co., Ltd., Hitachi Kenki Fine Tech Co., Ltd.. Active years: 2001-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiyuki Nagano. Retrieved from https://idiyas.com/inventor/yoshiyuki-nagano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6 

% Patents Active = 33.3

Average Co-Inventor Count = 5.3

ph-index = 4

Forward Citations = 81(Granted Patents)


Location History:

  • Ibaraki, JP (2001 - 2003)
  • Niihari-gun, JP (2004)
  • Tsuchiura, JP (2007 - 2008)

Company Filing History:


Years Active: 2001-2008

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6 patents (USPTO):Explore Patents

Title: The Innovations of Yoshiyuki Nagano

Introduction

Yoshiyuki Nagano is a prominent inventor based in Tsuchiura, Japan. He has made significant contributions to the field of microscopy, particularly through his innovative patents. With a total of six patents to his name, Nagano's work has advanced the capabilities of scanning probe microscopes.

Latest Patents

Nagano's latest patents include a scanning type probe microscope and a probe moving control method. The probe tip movement control method is designed for a scanning probe microscope equipped with a cantilever that has a probe tip facing a sample. This method measures the atomic force occurring between the probe tip and the sample as the probe scans the surface. The invention features X-, Y-, and Z-fine movement mechanisms that allow for precise adjustments in the positions of the probe tip and the sample. This innovation enables high measurement accuracy and facilitates the scanning of uneven sample surfaces with simple control. Another notable patent is the scanning probe microscope and measurement method, which includes a cantilever with a probe and a measurement section for assessing physical quantities between the probe and the sample. This microscope incorporates a probe tilt mechanism and an optical microscope to detect the probe's position, ensuring accurate measurements at various tilt postures.

Career Highlights

Throughout his career, Nagano has worked with notable companies such as Hitachi Construction Machinery Co., Ltd. and Hitachi Kenki Fine Tech Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced measurement technologies.

Collaborations

Nagano has collaborated with esteemed colleagues, including Tooru Kurenuma and Hideto Ishibashi. Their joint efforts have furthered the research and development of innovative technologies in microscopy.

Conclusion

Yoshiyuki Nagano's contributions to the field of microscopy through his patents and collaborations highlight his role as a leading inventor. His work continues to influence advancements in measurement technologies, showcasing the importance of innovation in scientific research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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