Yoshihiro Kashiba

This inventor holds 22 USPTO granted patents, primarily in Semiconductor Testing. Top assignees: Mitsubishi Denki Kabushiki Kaisha, Other. Active years: 1992-2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiro Kashiba. Retrieved from https://idiyas.com/inventor/yoshihiro-kashiba

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 22

% Patents Active = 72.7

Average Co-Inventor Count = 3.7

ph-index = 11

Forward Citations = 304(Granted Patents)

Location History:

Amagasaki, JP (1992 - 1997)
Hyogo, JP (2000)
Tokyo, JP (1997 - 2007)

Company Filing History:

20 out of 21,351

Mitsubishi Denki Kabushiki Kaisha

patents

2 out of 834,513

Other

patents

Years Active: 1992-2007

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Areas of Expertise:

Semiconductor Device

Test Probe

Test Socket

Probe Card

High-Frequency Circuit

Manufacturing Method

Cooling Plates

Ceramic-Metal Composite

22 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7276923 - Semiconductor device test probe (2007-10-02),

2. 7274195 - Semiconductor device test probe (2007-09-25),

3. 7112976 - Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested (2006-09-26),

4. 6989681 - Socket for testing a semiconductor device and a connecting sheet used for the same (2006-01-24),

5. 6979843 - Power semiconductor device (2005-12-27),

6. 6888344 - Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter (2005-05-03),

7. 6885204 - Probe card, and testing apparatus having the same (2005-04-26),

8. 6882069 - Vehicle AC generator with rectifier diode package disposed between cooling plates (2005-04-19),

9. 6867484 - Semiconductor device (2005-03-15),

10. 6794890 - Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested (2004-09-21),

11. 6741086 - Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus (2004-05-25),

12. 6667626 - Probe card, and testing apparatus having the same (2003-12-23),

13. 6646455 - Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter (2003-11-11),

14. 6633176 - Semiconductor device test probe having improved tip portion and manufacturing method thereof (2003-10-14),

15. 6628127 - Probe card for testing semiconductor integrated circuit and method of manufacturing the same (2003-09-30),

Title: Yoshihiro Kashiba - Innovative Inventor from Tokyo

Introduction: Yoshihiro Kashiba is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to various fields of technology and innovation.

Latest Patents: Yoshihiro Kashiba holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With over two decades of experience in the industry, Yoshihiro Kashiba has worked with leading research institutions and universities to develop cutting-edge technologies that have revolutionized the way we approach everyday challenges.

Collaborations: Throughout his career, Yoshihiro Kashiba has collaborated with top companies and fellow inventors to bring his ideas to life, fostering a culture of innovation and creativity in the process.

Conclusion: Yoshihiro Kashiba's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor, inspiring the next generation of innovators to push the boundaries of what is possible.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]