This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignees: Taiyuan University of Technology, Zhejiang University. Active years: 2023-2025.
Location History:
- Shanxi, CN (2023)
- Taiyuan, CN (2024)
Company Filing History:

Years Active: 2023-2025
Title: Yanxia Cui: Innovator in Silicon Carbide Technology
Introduction
Yanxia Cui is a prominent inventor based in Shanxi, China. He has made significant contributions to the field of semiconductor technology, particularly in the development of high-resistance resistors and organic photomultiplication photodetectors. With a total of 3 patents to his name, Cui's work is recognized for its innovative approaches and practical applications.
Latest Patents
Cui's latest patents include a high-resistance resistor based on silicon carbide and a method for producing an organic photomultiplication photodetector with bi-directional bias response. The high-resistance resistor utilizes a semi-insulating 4H—SiC silicon carbide substrate, featuring symmetrical atomic-thickness aluminum oxide insulating layers. This design allows for the creation of a resistor with a resistance of 100 TΩ or more, meeting the precision measurement industry's requirements. The organic photomultiplication photodetector patent details a device that includes an anode layer, an anode modification layer, an interfacial modification layer, an active layer, and a cathode layer, all arranged in sequence to enhance performance.
Career Highlights
Cui has held positions at notable institutions such as Taiyuan University of Technology and Zhejiang University. His work at these universities has contributed to advancements in semiconductor research and development.
Collaborations
Cui has collaborated with esteemed colleagues, including Guohui Li and Bingshe Xu, who have played significant roles in his research endeavors.
Conclusion
Yanxia Cui's innovative work in semiconductor technology continues to impact the industry positively. His patents reflect a commitment to advancing technology and improving precision measurement capabilities.