Modiin, Israel

Yakov Weinberg


Average Co-Inventor Count = 3.5

ph-index = 2

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 2013-2019

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8 patents (USPTO):Explore Patents

Title: Yakov Weinberg: Innovator in Multilayer Structure Measurement

Introduction

Yakov Weinberg is a prominent inventor based in Modiin, Israel. He has made significant contributions to the field of multilayer structures, holding a total of eight patents. His innovative techniques have advanced the methods used to measure overlay between layers in complex structures.

Latest Patents

One of Yakov Weinberg's latest patents is a technique for measuring overlay between layers of a multilayer structure. This method involves obtaining a given image that represents the multilayer structure and acquiring expected images for the individual layers. The process includes providing a combined expected image of the multilayer structure, performing registration of the given image against this combined expected image, and segmenting the given image to produce a segmented image along with maps of the layers. Furthermore, the method allows for determining the overlay between any two selected layers by processing the maps of those layers alongside their expected images.

Career Highlights

Yakov Weinberg is currently employed at Applied Materials Israel Limited, where he continues to develop innovative solutions in the field of multilayer structures. His work has been instrumental in enhancing the accuracy and efficiency of measurements in this area.

Collaborations

Yakov has collaborated with notable coworkers, including Ishai Schwarzband and Roman Kris, contributing to a dynamic and innovative work environment.

Conclusion

Yakov Weinberg's contributions to the field of multilayer structure measurement exemplify the impact of innovation in technology. His patents and ongoing work at Applied Materials Israel Limited continue to push the boundaries of what is possible in this specialized area.

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