Xiaolei Cai

Title: Innovations of Xiaolei Cai

Introduction

Xiaolei Cai is an accomplished inventor based in Portland, OR (US). She has made significant contributions to the field of integrated circuit design, holding a total of three patents. Her work focuses on defect characterization methods that enhance the reliability and performance of electronic devices.

Latest Patents

One of her latest patents is titled "Cell-aware defect characterization by considering inter-cell timing." This invention discloses a method and apparatus that determines whether a defect can be detected in a standard library cell used to design an integrated circuit. A defect detection table is generated, indicating whether particular defects can be detected with specific combinations of input logic states and under varying load conditions. The results are merged to provide a single metric for each combination of input and output logic states, indicating one of three possible results for each defect: whether it can be detected under all load conditions, only under some load conditions, or not at all.

Another notable patent is "Cell-aware defect characterization for multibit cells." This method involves partitioning a multibit cell netlist file into multiple single-bit partition netlist files. A cell-aware test model is generated for each partition netlist file, ensuring that each includes a corresponding flip-flop along with its input, output, and control pins. The partitioning process is performed using either a structural back-tracing approach or a logic simulation approach.

Career Highlights

Xiaolei has worked with prominent companies in the technology sector, including Synopsys, Inc. and Synopsis Incorporated. Her experience in these organizations has allowed her to refine her skills and contribute to innovative projects in integrated circuit design.

Collaborations

Xiaolei has collaborated with talented individuals such as Ruifeng Guo and Brian Archer. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Xiaolei Cai is a pioneering inventor whose work in defect characterization has significantly impacted the field of integrated circuit design. Her innovative patents and collaborations highlight her dedication to advancing technology and improving electronic device reliability.