Location History:
- Loveland, CO (US) (2008)
- Santa Clara, CA (US) (2011)
- Los Altos, CA (US) (2006 - 2022)
Company Filing History:
Years Active: 2006-2022
Title: William Clay Schluchter: Innovator in Optical Measurement Technologies
Introduction
William Clay Schluchter is a prominent inventor based in Los Altos, California. He has made significant contributions to the field of optical measurement technologies, holding a total of 9 patents. His work focuses on enhancing the accuracy and reliability of interferometric measurements.
Latest Patents
One of Schluchter's latest patents is titled "Systems and methods for cyclic error correction in a heterodyne interferometer." This invention addresses the challenges posed by cyclic errors in interferometric measurements, which can arise from various factors such as imperfect polarization relationships and deficiencies in optical propagation paths. By incorporating error correction elements, this patent aims to reduce or eliminate these errors, thereby improving measurement accuracy.
Another notable patent is the "Displacement measurement system and method of use." This system features a sensor head that transmits input optical beams and receives measurement beams. It includes a transmission grating that diffracts the input beams into multiple sub-beams, which are then processed to form measurement beams. This innovative approach enhances the precision of displacement measurements.
Career Highlights
Throughout his career, William Clay Schluchter has worked with leading companies in the technology sector, including Agilent Technologies, Inc. and Keysight Technologies, Inc. His experience in these organizations has allowed him to develop and refine his inventions, contributing to advancements in optical measurement systems.
Collaborations
Schluchter has collaborated with notable professionals in his field, including Alan B Ray and Miao Zhu. These partnerships have fostered innovation and have played a crucial role in the development of his patented technologies.
Conclusion
William Clay Schluchter's contributions to optical measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in interferometric measurements, paving the way for future advancements in the field.
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