Location History:
- Leuven, BE (2014 - 2017)
- Mechelen, BE (1994 - 2023)
Company Filing History:
11 out of 960 
9 out of 557 
4 out of 178 
Years Active: 1994-2023
Title: **Wilfried B Vandervorst: A Pioneer in Scanning Probe Microscopy**
Introduction
Wilfried B Vandervorst, hailing from Mechelen, Belgium, is a distinguished inventor known for his significant contributions to the field of microscopy, particularly scanning probe microscopy. With an impressive portfolio of 27 patents, he continues to push the boundaries of innovation in measuring surface characteristics of materials.
Latest Patents
Among his latest inventions is a patent titled "Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample." This invention focuses on improved techniques for aligning an SPM probe accurately to the apex of a pointed sample. The method encompasses the usage of an SPM apparatus coupled with detailed mechanisms designed to provide enhanced imaging capabilities of the scanned surfaces.
Another notable patent by Vandervorst is "Device for measuring surface characteristics of a material." This device utilizes a novel configuration of electrodes, allowing the evaluation of semiconductor samples by transforming the sample surface into a transistor. This innovation simplifies the process of determining critical characteristics of materials, making it an essential tool in the field.
Career Highlights
Vandervorst has contributed immensely to the scientific community through his work at various organizations, primarily at imec, a renowned research institution. His expertise in microscopy and surface analysis has earned him recognition in the field, and his 27 patents stand as a testament to his innovative spirit and technical prowess.
Collaborations
Throughout his career, Vandervorst has collaborated with notable professionals, including Thomas Hantschel and Kristof Paredis. These partnerships have facilitated knowledge exchange and spurred advancements in technology, further enhancing the impact of their collective work on the scientific community.
Conclusion
Wilfried B Vandervorst is a pivotal figure in the landscape of scanning probe microscopy. His cutting-edge patents and collaborations illustrate his dedication to advancing technology and providing tools that enhance research capabilities in measuring surface characteristics. His ongoing contributions will undoubtedly inspire future innovations in the microscopy field.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.