Wen-Wei Yeh

Title: Innovations of Inventor Wen-Wei Yeh

Introduction

Wen-Wei Yeh is a notable inventor based in Bade, Taiwan. He has made significant contributions to the field of NAND flash memory technology. With a total of 3 patents, his work has advanced the efficiency and functionality of memory storage systems.

Latest Patents

Wen-Wei Yeh's latest patents include a "Forced-bias method in sub-block erase." This method provides a way to operate a NAND array that consists of multiple blocks of memory cells. The process involves applying a channel-side erase voltage to channel lines through string select switches in a selected block. Additionally, word line-side erase voltages are applied to a subset of word lines to induce tunneling in memory cells. Another significant patent is the "Pre-reading method and programming method for 3D NAND flash memory." This method outlines steps for reading data from a selected string of memory cells, ensuring that the applied voltages are optimized for efficient data retrieval.

Career Highlights

Wen-Wei Yeh is currently employed at Macronix International Co., Ltd. His work at this company has been pivotal in developing advanced memory technologies. His innovative approaches have contributed to the company's reputation as a leader in the semiconductor industry.

Collaborations

Wen-Wei Yeh has collaborated with notable colleagues, including Kuo-Pin Chang and Chih-Shen Chang. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Wen-Wei Yeh's contributions to NAND flash memory technology exemplify his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving memory storage solutions, making a lasting impact on the industry.