Wen-Tsai Su

Title: The Innovations of Wen-Tsai Su

Introduction

Wen-Tsai Su is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the development of methods and apparatuses for detecting contact forces in probe cards. With a total of 5 patents to his name, Su's work has had a substantial impact on the efficiency and accuracy of semiconductor testing.

Latest Patents

One of his latest patents is titled "Method for detecting contact force of probe card." This innovative method involves using a pressure film sensor that contacts a plurality of needles on the lower surface of the probe card. The sensor detects the contact force, allowing for adjustments to be made to the position of a push base on the upper surface of the probe card based on the detected force. Another notable patent is "Probe card, apparatus and method for detecting contact force of probe card." This apparatus includes a stage and a plate, along with a pressure film sensor designed to detect the contact force between the needles on a probe head and the sensor itself. Additionally, it features a distance detector and an adjustment driver to enhance the functionality of the probe card.

Career Highlights

Wen-Tsai Su is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work at this company has allowed him to collaborate with other talented professionals in the field, further advancing the technology surrounding probe cards and semiconductor testing.

Collaborations

Some of his notable coworkers include Ming-Cheng Hsu and Te-Kun Lin, who have also contributed to various projects within the company. Their collaborative efforts have played a crucial role in the development of innovative solutions in semiconductor technology.

Conclusion

Wen-Tsai Su's contributions to the field of semiconductor technology through his patents and collaborative work have established him as a key figure in the industry. His innovative methods for detecting contact forces in probe cards continue to influence advancements in semiconductor testing.