Shanghai, China

Wen Shi

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignees: Semiconductor Manufacturing International (Shanghai) Corporation, Tdk Electronics Ag. Active years: 2008-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wen Shi. Retrieved from https://idiyas.com/inventor/wen-shi-3ko7249q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 100.0

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2008-2020

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4 patents (USPTO):Explore Patents

Title: Innovations of Inventor Wen Shi

Introduction

Wen Shi is a notable inventor based in Shanghai, China, recognized for his contributions to the field of materials science and electrical engineering. He holds a total of four patents, showcasing his innovative spirit and technical expertise.

Latest Patents

One of his latest patents is the "Lead-free high-insulating ceramic coating zinc oxide arrester valve and preparation method thereof." This invention discloses a lead-free insulating ceramic coating zinc oxide arrester valve and a method for its manufacturing. The method involves preparing an initial powder from specific starting materials, including ZnO, Bi2O3, Co3O4, Mn3O4, Sb2O3, NiO, and SiO2. The process includes mixing the initial powder with deionized water, milling, drying, and pulverizing the mixture to create a ceramic coating slurry. This slurry is then applied to a green body, followed by heating and debinding to form a resistor element, ultimately resulting in a zinc oxide surge arrester valve block with a lead-free insulating ceramic coating.

Another significant patent is the "Reliability test structure for multilevel interconnect." This invention relates to structures and methods that allow for testing stress-induced electromigration in multiple interconnect metallization layers. The testing structure comprises segments of different metal layers through via structures, with nodes designed to receive force and sense voltages. This setup enables rapid and precise detection of stress-induced migration in each metal layer.

Career Highlights

Wen Shi has worked with prominent companies, including Semiconductor Manufacturing International Corporation and TDK Electronics AG. His experience in these organizations has contributed to his development as an inventor and innovator in the field.

Collaborations

Wen has collaborated with notable coworkers, including Wei Ruan and Guangqiang Pei, who have contributed to his projects and innovations.

Conclusion

Wen Shi's innovative work in the field of materials science and electrical engineering has led to significant advancements, particularly in the development of lead-free ceramic coatings and reliability testing structures. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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