Weinan Ye

Title: Weinan Ye: Innovator in Heterodyne Grating Interferometry

Introduction

Weinan Ye is a prominent inventor based in Beijing, China. He has made significant contributions to the field of interferometry, particularly through his innovative patents. With a total of seven patents to his name, Ye has established himself as a key figure in advancing measurement technologies.

Latest Patents

One of Weinan Ye's latest patents is the "Heterodyne Grating Interferometry System Based on Secondary Diffraction." This system includes a single-frequency laser, an input optical fiber, an acousto-optic modulator, a reading head, a measurement grating, an output optical fiber, a photoelectric conversion unit, and an electronic signal processing unit. The system is designed to emit a single-frequency laser that is divided into reference and measurement light, which are then processed to generate interference signals.

Another notable patent is the "Five-Degree-of-Freedom Heterodyne Grating Interferometry System." This system features a single-frequency laser that splits light into reference and measurement beams. It utilizes an interferometer lens set and a measurement grating to convert these beams into interference signals. The design is compact and not overly sensitive to environmental factors, allowing for six-degree-of-freedom ultra-precision measurement when multiple systems are arranged together.

Career Highlights

Weinan Ye has worked at prestigious institutions, including Tsinghua University and Beijing U-Precision Tech Co., Ltd. His work has focused on developing advanced measurement systems that enhance precision in various applications. His innovative approaches have garnered attention in the field of optical engineering.

Collaborations

Throughout his career, Weinan Ye has collaborated with notable colleagues, including Yu Zhu and Ming Lei Zhang. These partnerships have contributed to the development of his groundbreaking technologies and patents.

Conclusion

Weinan Ye's contributions to the field of interferometry through his innovative patents have significantly advanced measurement technologies. His work continues to influence the industry and inspire future innovations.