Wajih Dalal

Title: Wajih Dalal: Innovator in High-Speed Data Measurement

Introduction

Wajih Dalal is a notable inventor based in Palo Alto, CA, who has made significant contributions to the field of high-speed data measurement. With a total of 2 patents, his work focuses on enhancing the accuracy and efficiency of data transmission technologies.

Latest Patents

Dalal's latest patents include innovative techniques for measuring jitter in high-speed data channels. This technique utilizes a high-bandwidth undersampling voltage measurement instrument to derive a trigger from a signal with a repetitive pattern. By comparing the signal with a threshold at various times relative to the trigger, he produces measurement samples that indicate the signal level. These samples help determine the probability of signal edge states over time, leading to the creation of a histogram of signal state transition times. Additionally, he has developed a method for quantifying tester edge placement accuracy (EPA) for semiconductor devices. This simulation models the interaction between tester accuracy and device edge distribution, revealing significant financial implications for manufacturers.

Career Highlights

Throughout his career, Wajih Dalal has worked with prominent companies such as Nptest, Inc. and Schlumberger Technologies, Inc. His experience in these organizations has allowed him to refine his expertise in high-speed data measurement and testing technologies.

Collaborations

Dalal has collaborated with notable professionals in his field, including Daniel A. Rosenthal and Song Miao. These partnerships have contributed to the advancement of his innovative projects and patents.

Conclusion

Wajih Dalal's contributions to high-speed data measurement and testing accuracy have established him as a key figure in the field. His innovative patents and collaborations reflect his commitment to advancing technology in this critical area.