The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Oct. 17, 1999
Wajih Dalal, Palo Alto, CA (US);
Daniel A. Rosenthal, Saratoga, CA (US);
NPTest, LLP, San Jose, CA (US);
Abstract
A jitter measurement technique utilizing a high-bandwidth undersampling voltage measurement instrument is presented. A trigger is derived from the a signal having a repetitive signal pattern. The signal is compared with a threshold at a plurality of times relative to the trigger during multiple repetitions of the signal pattern to produce measurement samples indicative of signal level relative to the threshold. The measurement samples are used to determine the probability of signal edge states as a function of time for the multiple repetitions. The probability of signal edge states are used to determine an edge probability density as a function of time. A histogram of signal state transition times can be prepared from the edge probability density. Mean deviation of edge transitions of the signal can be estimates, and standard deviation of edge transitions of the signal can be estimated to give the root-mean-square (rms) jitter of the signal.