Company Filing History:
Years Active: 2006-2023
Title: Uta-Barbara Goers: Innovator in Measurement Technologies
Introduction
Uta-Barbara Goers, an esteemed inventor based in Campbell, NY, has significantly contributed to measurement technologies with 11 patents to her name. Her work primarily focuses on methods for accurately measuring geometric parameters of holes in substrates, showcasing her expertise in optical systems and image processing.
Latest Patents
Among her latest inventions is a groundbreaking patent titled "Method and System for Measuring Geometric Parameters of Through Holes." This method involves acquiring images of select sub-volumes of a thin substrate using an optical system that possesses a depth of field greater than the thickness of the substrate. The images obtained are then processed to extract the necessary geometric parameters, enhancing precision in measurement applications. Notably, this innovation has been repeated in another patent, emphasizing its significance and utility in various industries.
Career Highlights
Uta-Barbara Goers has built her career at prominent research institutions and companies, including Corning Incorporated and Sandia National Laboratories. Her experiences at these organizations have not only honed her skills in her field but also allowed her to be at the forefront of technological advancements, making substantial impacts in measurement methodologies.
Collaborations
Throughout her career, Uta-Barbara has collaborated with notable individuals, including Robert Carl Burket and Samuel Odei Owusu. These partnerships have facilitated the development of her innovative ideas, leading to the successful creation and patenting of her inventions.
Conclusion
Uta-Barbara Goers is a remarkable inventor whose work in developing methods for measuring geometric parameters has propelled advancements in related technologies. With 11 patents and a notable career at leading research institutions, she exemplifies the spirit of innovation that drives progress in measurement technologies. Her contributions continue to influence fields requiring precision and accuracy in measurement solutions.