Company Filing History:
Years Active: 2009-2015
Title: Ulf Hackius: Innovator in Semiconductor Testing Technology
Introduction
Ulf Hackius is a prominent inventor based in Dresden, Germany, known for his contributions to the field of semiconductor testing technology. With a total of three patents to his name, Hackius has made significant advancements that enhance the efficiency and accuracy of electronic component testing.
Latest Patents
One of Hackius's latest patents is titled "Modular Prober and Method for Operating Same." This invention relates to a prober designed for checking and testing electronic semiconductor components. The prober features at least two checking units, each equipped with a chuck, probes, and a positioning unit. Each unit is assigned to a machine control system and a process control system. Additionally, the prober includes a loading unit for automatic loading of both testing units and a manual loader for at least one of the testing units. A user interface and a module control system are also part of the design, allowing for seamless control of the testing process.
Another notable patent is "Arrangement and Method for Focusing a Multiplane Image Acquisition on a Prober." This innovation enables focused multi-planar image acquisition in real-time, even while a test object is in motion. The system allows for the microscope to focus on the surface of a test object and the plane of the probe needles at different times, enhancing the precision of the testing process.
Career Highlights
Throughout his career, Ulf Hackius has worked with several notable companies, including Cascade Microtech, Inc. and Suss Microtec Test Systems GmbH. His experience in these organizations has contributed to his expertise in semiconductor testing technologies.
Collaborations
Hackius has collaborated with professionals such as Axel Becker and Stojan Kanev, further enriching his work and innovations in the field.
Conclusion
Ulf Hackius stands out as a key figure in the semiconductor testing industry, with his innovative patents and extensive career experience. His contributions continue to shape the future of electronic component testing technology.