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Toshimi Ohsawa

USPTO Granted Patents = 7

Average Co-Inventor Count = 1.3

ph-index = 6

Forward Citations = 92(Granted Patents)

Location History:

Saitama-ken, JP (1997)
Gyoda, JP (1997 - 2003)
Tokyo, JP (2008)

Company Filing History:

Adv Antest Corporation

Years Active: 1997-2008

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7 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7441166 - Testing apparatus and testing method (2008-10-21),

2. 6513138 - Pattern generator for semiconductor test system (2003-01-28),

3. 5717694 - Fail analysis device for semiconductor memory test system (1998-02-10),

4. 5682393 - Pattern generator for cycle delay (1997-10-28),

5. 5673271 - High speed pattern generator (1997-09-30),

6. 5646948 - Apparatus for concurrently testing a plurality of semiconductor memories (1997-07-08),

7. 5644578 - Failure memory device (1997-07-01),

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