The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 1997

Filed:

Aug. 15, 1995
Applicant:
Inventor:

Toshimi Ohsawa, Gyoda, JP;

Assignee:

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 27 ; 371 62 ; 395552 ;
Abstract

A pattern generator facilitates the pattern generation of an electronics device to be measured such as SDRAM where each input and output signal cycle is not matched. The pattern generator includes a first address signal delay section that applies a cycle delay to a first address signal based on the number set in a first delay register, a second address signal delay section that applies a cycle delay to a second address signal based on the number set in a second delay register, a data signal delay section that applies a cycle delay to a data signal based on the number set in a data delay register, a control signal delay section that applies cycle delay to a control signal based on the number set in a control delay register.


Find Patent Forward Citations

Ohsawa, Toshimi. (1997). Pattern generator for cycle delay (U.S. Patent No. 5682393). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5682393

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…