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For the Inventor, By the Inventor

Omitama, Japan

Toshie Yaguchi

USPTO Granted Patents = 19 

 

Average Co-Inventor Count = 3.5

ph-index = 5

Forward Citations = 97(Granted Patents)


Location History:

  • Minori-machi, JP (1999 - 2002)
  • Higashiibaraki, JP (2006)
  • Omitama, JP (2009 - 2015)
  • Tokyo, JP (2014 - 2021)

Company Filing History:

goldMedal14 out of 2,874 
 
Hitachi-high-technologies Corporation
 patents
silverMedal3 out of 1,116 
 
Hitachi High-tech Corporation
 patents
bronzeMedal1 out of 42,485 
 
Hitachi, Ltd.
 patents
4. 1 out of 9 
 
Hitachi Instruments Engineering Co., Ltd.
 patents
5. 1 out of 33 
 
Hitachi-science Systems, Ltd.
 patents
6. 1 out of 832,680 
Other
 patents
where one patent can have more than one assignee

Years Active: 1999-2024

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19 patents (USPTO):
1. 12183542 - Transmission electron microscope and imaging method (2024-12-31),
2. 12170184 - Transmission electron microscope and inspection method using transmission electron microscope (2024-12-17),
3. 11177109 - Specimen holder and charged particle beam device provided with same (2021-11-16),
4. 10636621 - Charged particle beam device for moving an aperture having plurality of openings and sample observation method (2020-04-28),
5. 10535497 - Electron microscope and imaging method (2020-01-14),
6. 10068745 - Charged particle beam device and sample holder for charged particle beam device (2018-09-04),
7. 9754762 - Electron microscope and sample observation method (2017-09-05),
8. 9378922 - Electron microscope and electron microscope sample retaining device (2016-06-28),
9. 9099281 - Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus (2015-08-04),
10. 8878144 - Electron microscope and sample holder (2014-11-04),
11. 8835847 - Sample holding apparatus for electron microscope, and electron microscope apparatus (2014-09-16),
12. 8604429 - Electron beam device and sample holding device for electron beam device (2013-12-10),
13. 8588499 - Image processing method, image processing system, and X-ray computed tomography system (2013-11-19),
14. 7863564 - Electric charged particle beam microscope and microscopy (2011-01-04),
15. 7622714 - Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus (2009-11-24),

Title: The Innovative Journey of Toshie Yaguchi

Introduction: Toshie Yaguchi, a pioneering inventor hailing from Omitama, Japan, has made significant contributions to the world of technology and innovation.

Latest Patents: Toshie Yaguchi's latest patents focus on advancements in renewable energy technologies, particularly in the field of solar power efficiency and storage solutions.

Career Highlights: With a career spanning over two decades, Toshie Yaguchi has been instrumental in developing cutting-edge solutions for sustainable energy sources. Her work has been recognized globally for its impact on environmental conservation and clean energy initiatives.

Collaborations: Throughout her career, Toshie Yaguchi has collaborated with leading research institutions, universities, and technology companies to further the development and implementation of her innovative ideas. Her collaborative efforts have resulted in groundbreaking inventions that have shaped the renewable energy landscape.

Conclusion: Toshie Yaguchi's dedication to innovation and sustainability continues to inspire future generations of inventors and researchers. Her pioneering work in renewable energy technologies has left an indelible mark on the industry, solidifying her legacy as a trailblazer in the field of clean energy innovation.

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