The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Apr. 13, 2021
Applicant:
Hitachi High-tech Corporation, Tokyo, JP;
Inventors:
Assignee:
Hitachi High-Tech Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/153 (2006.01); H01J 37/18 (2006.01); H01J 37/20 (2006.01); H01J 37/295 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/153 (2013.01); H01J 37/18 (2013.01); H01J 37/20 (2013.01); H01J 37/295 (2013.01); H01J 37/32449 (2013.01);
Abstract
An object of the invention is to reduce influence of a phase contrast on an observation image in a transmission electron microscope and to enable image observation with high magnification and high resolution. The transmission electron microscope according to the invention can switch between a first mode in which a lens barrel is airtightly sealed between an electron beam source side and a stage side by a diaphragm, and a second mode in which the lens barrel is not airtightly sealed.