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For the Inventor, By the Inventor

Yokohama, Japan

Tomomi Momohara

This inventor holds 14 USPTO granted patents. Top assignee: Kabushiki Kaisha Toshiba. Active years: 1996-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomomi Momohara. Retrieved from https://idiyas.com/inventor/tomomi-momohara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 14

% Patents Active = 71.4

Average Co-Inventor Count = 1.0

ph-index = 7

Forward Citations = 221(Granted Patents)


Company Filing History:

goldMedal14 out of 53,250 
 
Kabushiki Kaisha Toshiba
 patents

Years Active: 1996-2009

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14 patents (USPTO):Explore Patents
1. RE41016 - Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits (2009-11-30),
2. 7549097 - Semiconductor integrated circuit device and method of testing the same (2009-06-16),
3. RE40105 - Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits (2008-02-25),
4. 7208759 - Semiconductor integrated circuit device and method of testing the same (2007-04-24),
5. 7002232 - Semiconductor integrated circuit device and method of testing the same (2006-02-21),
6. 6750527 - Semiconductor integrated circuit device having a plurality of wells, test method of testing the semiconductor integrated circuit device, and test device which executes the test method (2004-06-15),
7. 6518073 - Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory devices (2003-02-11),
8. 6335209 - Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory (2002-01-01),
9. 6094733 - Method for testing semiconductor memory devices, and apparatus and (2000-07-25),
10. 6055655 - Semiconductor integrated circuit device and method of testing the same (2000-04-25),
11. 5923600 - Semiconductor device and test method and apparatus for semiconductor (1999-07-13),
12. 5825783 - Semiconductor integrated circuit device with large-scale memory and (1998-10-20),
13. 5818249 - Probe card having groups of probe needles in a probing test apparatus (1998-10-06),
14. 5525912 - Probing equipment and a probing method (1996-06-11),

Title: The Innovative Contributions of Tomomi Momohara

Introduction

Tomomi Momohara is a prominent inventor based in Yokohama, Japan. She has made significant contributions to the field of semiconductor technology, holding a total of 14 patents. Her work focuses on enhancing the efficiency and cost-effectiveness of semiconductor integrated circuits.

Latest Patents

One of her latest patents is a probe card designed for testing semiconductor integrated circuits. This innovative probe card enhances productivity in the manufacturing process while reducing costs. It features groups of probe needles that contact semiconductor integrated circuits arranged in rows and columns. The card receives test signals from a test device and supplies them simultaneously to the integrated circuits. Additionally, it captures response signals from the circuits and relays them back to the tester. Another notable patent involves a method of testing semiconductor devices, specifically focusing on functional circuits like processors and flash-EEPROMs. This method includes a separating region that ensures the effective functioning of the semiconductor chip.

Career Highlights

Tomomi Momohara is currently employed at Kabushiki Kaisha Toshiba, where she continues to innovate in the semiconductor industry. Her work has been instrumental in advancing testing methodologies and improving the overall performance of semiconductor devices.

Conclusion

Tomomi Momohara's contributions to semiconductor technology exemplify her dedication to innovation and efficiency. Her patents reflect her commitment to enhancing manufacturing processes and reducing costs in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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