The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7002232 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 21, 2006

Filed:

Apr. 21, 2004
Applicant:

Tomomi Momohara, Yokohama, JP;

Inventor:

Tomomi Momohara, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/00 (2006.01); H01L 27/01 (2006.01); H01L 27/12 (2006.01); H01L 31/0392 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor integrated circuit device includes a semiconductor substrate of a first conductive type, a first well of a second conductive type provided in the semiconductor substrate, a second well of the first conductive type provided in the first well, a third well of the second conductive type provided in the semiconductor substrate, a fourth well of the first conductive type provided in the third well, semiconductor elements constructing a first functional integrated circuit provided in the first and second wells, semiconductor elements constructing a second functional integrated circuit provided in the third and fourth wells, and an internal power source voltage generating circuit provided in the first well. The internal power source voltage generating circuit configured to generate a first internal power source voltage is applied to the first functional integrated circuit and a second internal power source voltage is applied to the second functional integrated circuit.


Find Patent Forward Citations

Momohara, Tomomi. (2006). Semiconductor integrated circuit device and method of testing the same (U.S. Patent No. 7002232). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7002232

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