The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 1996
Filed:
Mar. 09, 1995
Applicant:
Inventor:
Tomomi Momohara, Yokohama, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324754 ; 324 731 ; 437-8 ; 382199 ; 439482 ; 414222 ;
Abstract
A wafer prober comprises a wafer chuck for chucking a wafer and a probe card holding section for holding two or more probe cards. The wafer prober further comprises a test section for simultaneously testing a plurality of chips among chips in one wafer, with use of the two or more probe cards, while respectively making probe sections included in the two or more probe cards be in contact with external terminal sections of the plurality of chips.
Momohara, Tomomi. (1996). Probing equipment and a probing method (U.S. Patent No. 5525912). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5525912
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile