The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Dec. 10, 2001
Applicant:
Inventor:
Tomomi Momohara, Yokohama, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/100 ;
Abstract
A method for testing a semiconductor device comprises executing a function test on the semiconductor device, executing a DC characteristic test on the semiconductor device, executing a remedy determination process of the semiconductor device, and executing a remedy process on the semiconductor device. The remedy determination process is performed in parallel to the DC test.
Momohara, Tomomi. (2003). Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory devices (U.S. Patent No. 6518073). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6518073
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile