Teruo Kohashi

This inventor holds 17 USPTO granted patents and 3 published patent applications, primarily in Charged Particle Microscopy. Top assignees: Hitachi, Ltd., Hitachi High-Tech Corporation. Active years: 2010-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Teruo Kohashi. Retrieved from https://idiyas.com/inventor/teruo-kohashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 17 (Patent Applications = 3)

% Patents Active = 47.1

Average Co-Inventor Count = 2.2

ph-index = 2

Forward Citations = 12(Granted Patents)

Location History:

Hachioji, JP (2010 - 2011)
Tokyo, JP (2018 - 2024)

Company Filing History:

Hitachi High-Tech Corporation

patents

Years Active: 2010-2026

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Areas of Expertise:

Spin-Polarized Scanning Electron Microscope

Charged Particle Beam Device

Scanning Probe Microscope

Magnetic Domain Image Processing

Image Acquisition System

Spin Polarimeter

Mirror Ion Microscope

Electron Spin Detector

Photoelectron Spectroscope

Diffraction Grating System

Transmission Electron Microscope

Charged Particle Irradiation

17 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12731760 - Spin-polarized scanning electron microscope (2026-09-08),

2. 12719010 - Charged particle beam device (2026-08-25),

3. 12650585 - Scanning probe microscope (2026-06-09),

4. 12400827 - Charged particle beam device (2025-08-26),

5. 11961699 - Charged particle beam device (2024-04-16),

6. 11756763 - Scanning electron microscope (2023-09-12),

7. 11587226 - Magnetic domain image processing apparatus and magnetic domain image processing method (2023-02-21),

8. 11170972 - Scanning electron microscope and method for analyzing secondary electron spin polarization (2021-11-09),

9. 11163974 - Image acquisition system and image acquisition method (2021-11-02),

10. 11139143 - Spin polarimeter (2021-10-05),

11. 10395885 - Charged particle device, charged particle irradiation method, and analysis device (2019-08-27),

12. 10304657 - Mirror ion microscope and ion beam control method (2019-05-28),

13. 10210962 - Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating (2019-02-19),

14. 9864114 - Zone plate having annular or spiral shape and Y-shaped branching edge dislocation (2018-01-09),

15. 8022364 - Electron spin detector, and spin polarized scanning electron microscope and spin-resolved x-ray photoelectron spectroscope using the electron spin detector (2011-09-20),

Title: The Innovative Journey of Teruo Kohashi

Introduction: Teruo Kohashi is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Teruo Kohashi holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to innovation.

Career Highlights: With over two decades of experience in the tech industry, Teruo Kohashi has worked with leading research institutions and universities to develop cutting-edge solutions that have revolutionized the way we interact with technology.

Collaborations: Throughout his career, Teruo Kohashi has collaborated with top companies in Japan and internationally, fostering a culture of innovation and pushing the boundaries of what is possible in the tech world.

Conclusion: Teruo Kohashi's passion for innovation and his relentless pursuit of excellence have solidified his position as a visionary inventor, shaping the future of technology in Japan and beyond.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

3 patents pending: