Tokyo, Japan

Teruhiko Funakura


Average Co-Inventor Count = 2.7

ph-index = 8

Forward Citations = 197(Granted Patents)


Location History:

  • Itami, JP (1992 - 1996)
  • Hyogo, JP (1999 - 2006)
  • Tokyo, JP (2001 - 2006)

Company Filing History:


Years Active: 1992-2006

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22 patents (USPTO):Explore Patents

Title: Teruhiko Funakura: Innovator in Analog Signal Testing

Introduction

Teruhiko Funakura, based in Tokyo, Japan, is a prominent inventor with an impressive portfolio of 22 patents. His innovative contributions have significantly advanced the field of analog signal testing and semiconductor integrated circuit evaluation.

Latest Patents

Among his latest inventions is a test circuit designed for evaluating the characteristics of analog signals in devices. This circuit includes a determination component that performs functional testing to verify if the timing of the slope section of an analog signal waveform remains within specified limits. The invention employs an Analog-to-Digital Converter (ADC) that conducts AD-conversion only when the analog signal falls within a predetermined voltage range. By utilizing an analysis unit, digital data from the ADC is evaluated to conduct sloping waveform tests on the analog signal, allowing for effective voltage range management without the need for extensive storage circuits.

Additionally, Funakura has developed an apparatus for testing semiconductor integrated circuits. This setup comprises a test circuit board alongside an ancillary test device capable of assessing digital circuits. The ancillary device features a test pattern memory, a signal generator for test patterns, and a control section that manages operations on selected test data sets. This allows for the generation of test input patterns based on the data written into the signal generator, facilitating accurate testing of digital circuits.

Career Highlights

Throughout his career, Funakura has contributed to significant advancements in testing technologies, working with industry-leading companies such as Renesas Technology Corporation. His expertise and creativity have made a lasting impact on the realm of electronic testing methodologies.

Collaborations

In his professional journey, Funakura has collaborated with talented individuals such as Hisaya Mori and Shinji Yamada. These collaborations have fostered a rich exchange of ideas and have played a pivotal role in advancing their collective innovations in semiconductor technologies.

Conclusion

Teruhiko Funakura stands as a key figure in the innovation landscape of analog signal testing and semiconductor circuit evaluation. With a remarkable number of patents and a dedication to advancing technology, his contributions will continue to influence the field for years to come.

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