The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Feb. 03, 2005
Toshiaki Tarui, Hyogo, JP;
Masaru Sugimoto, Hyogo, JP;
Hisaya Mori, Hyogo, JP;
Teruhiko Funakura, Hyogo, JP;
Toshiaki Tarui, Hyogo, JP;
Masaru Sugimoto, Hyogo, JP;
Hisaya Mori, Hyogo, JP;
Teruhiko Funakura, Hyogo, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
In a test circuit, a determination circuit conducts a function test to determine whether timing of a slope section of waveform of an analog signal ANS of a measurement target device is within a range of specifications. An ADC performs AD-conversion only when a potential of analog signal ANS is within a range between reference potentials VOL, VOH. An analysis unit analyzes digital data from the ADC, and conducts a sloping waveform test to evaluate a sloping state of the waveform of analog signal ANS. Therefore, the slope section of the waveform of analog signal ANS of the device can be subjected to AD-conversion in a voltage range divided in arbitrary number of sections within a range of arbitrary voltage amplitude without requiring a large-capacity storage circuit. The function test by a determination circuit and the sloping waveform test by the analysis unit can be performed in parallel.