The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Jul. 16, 2001
Applicant:
Inventors:

Hisaya Mori, Hyogo, JP;

Shinji Yamada, Hyogo, JP;

Teruhiko Funakura, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; G01R 3/126 ; G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/102 ; G01R 3/126 ; G01R 3/128 ;
Abstract

To provide a tester for semiconductor integrated circuits that can test an A/D converter circuit and a D/A converter circuit in a mixed signal type semiconductor integrated circuit comprising an A/D converter circuit and a D/A converter circuit at high accuracy and at high speed. A test assisting device is provided in the vicinity of a testing circuit board on which a semiconductor integrated circuit to be tested is mounted. The test assisting device comprises a data circuit to supply analog test signals to the A/D converter circuit of the semiconductor integrated circuit to be tested, and digital test signals to the D/A converter circuit thereof, a measured data memory to store test outputs from the semiconductor integrated circuit to be tested, and an analyzer portion to analyze data stored in the measured data memory.


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