Tatsuya Maeda

This inventor holds 28 USPTO granted patents and 1 published patent application, primarily in Scanning Electron Microscopy. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd.. Active years: 1996-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatsuya Maeda. Retrieved from https://idiyas.com/inventor/tatsuya-maeda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28 (Patent Applications = 1)

% Patents Active = 67.9

Average Co-Inventor Count = 3.1

ph-index = 7

Forward Citations = 164(Granted Patents)

Location History:

Katsuta, JP (1997)
Hitachinaka, JP (1996 - 2015)

Company Filing History:

17 out of 2,874

Hitachi-High-Technologies Corporation

Years Active: 1996-2025

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Areas of Expertise:

Power Generation Planning

Pattern Measurement

Image Processing

Scanning Electron Microscope

Charged Particle Beam

Tool-to-Tool Matching

Fine Pattern Feature

Sample Observation Condition

Displacement Measurement

Alignment Method

Auto Focusing

28 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12399013 - Power generation planning device and power generation planning method (2025-08-26),

2. 12191663 - Power supply and demand planning device (2025-01-07),

3. 9000366 - Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns (2015-04-07),

4. 8872106 - Pattern measuring apparatus (2014-10-28),

5. 8666165 - Scanning electron microscope (2014-03-04),

6. 8502144 - Tool-to-tool matching control method and its system for scanning electron microscope (2013-08-06),

7. 8384030 - Method and apparatus for setting sample observation condition, and method and apparatus for sample observation (2013-02-26),

8. 8207512 - Charged particle beam apparatus and methods for capturing images using the same (2012-06-26),

9. 8200006 - Image processing apparatus for analysis of pattern matching failure (2012-06-12),

10. 8188427 - Scanning electron microscope alignment method and scanning electron microscope (2012-05-29),

11. 8124934 - Scanning electron microscope (2012-02-28),

12. 8003940 - Tool-to-tool matching control method and its system for scanning electron microscope (2011-08-23),

13. 7807980 - Charged particle beam apparatus and methods for capturing images using the same (2010-10-05),

14. 7684937 - Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication (2010-03-23),

15. 7545977 - Image processing apparatus for analysis of pattern matching failure (2009-06-09),

Title: Tatsuya Maeda: Pioneering Inventor from Hitachinaka

Introduction: Tatsuya Maeda is a renowned inventor hailing from Hitachinaka, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Tatsuya Maeda holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Tatsuya Maeda has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Tatsuya Maeda has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Tatsuya Maeda's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor, shaping the landscape of technology for years to come.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent pending: