The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
May. 04, 2009
Applicants:
Mitsuji Ikeda, Hitachinaka, JP;
Tatsuya Maeda, Hitachinaka, JP;
Osamu Nasu, Hitachinaka, JP;
Fumihiro Sasajima, Hitachinaka, JP;
Inventors:
Mitsuji Ikeda, Hitachinaka, JP;
Tatsuya Maeda, Hitachinaka, JP;
Osamu Nasu, Hitachinaka, JP;
Fumihiro Sasajima, Hitachinaka, JP;
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Information indicating the reason for a failure of template matching is provided. Difference information between a first image, which is referred to as a template, and a third image that is selected by the operator from a second image and that is larger than the template is displayed.
Ikeda, Mitsuji. (2012). Image processing apparatus for analysis of pattern matching failure (U.S. Patent No. 8200006). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8200006
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile