Hitachinaka, Japan

Takeshi Sunaoshi


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Location History:

  • Hitachinaka, JP (2010 - 2011)
  • Tokyo, JP (2019 - 2020)

Company Filing History:


Years Active: 2010-2020

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6 patents (USPTO):Explore Patents

Title: Innovations by Takeshi Sunaoshi

Introduction

Takeshi Sunaoshi is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 6 patents. His work focuses on enhancing the functionality and efficiency of electron microscopes and related apparatuses.

Latest Patents

One of Sunaoshi's latest inventions is a charged particle beam apparatus and control method. This invention is designed to maintain temperature in a cooling unit within a vacuum application apparatus using a refrigerant. The apparatus includes a cooling tank that contains the refrigerant, a cooling pipe that supplies the refrigerant to the cooling unit, and a unit that facilitates the liquefaction of the refrigerant when it is biased to a solid state.

Another notable patent is for an electron microscope that allows for stable and high-accuracy sample observation. This microscope features a sample stage, an electron optical system for scanning an electron beam over a sample, and a vacuum system that maintains the necessary conditions for operation. It also includes a secondary electron detector and transmitted electron detectors to capture images based on the detected electrons. The sample stage is equipped with cooling means, and the vacuum system has a cold trap to remove moisture from the vicinity of the sample.

Career Highlights

Takeshi Sunaoshi is associated with Hitachi High-Technologies Corporation, where he has been instrumental in advancing technologies related to electron microscopy and charged particle beams. His innovative work has positioned him as a key figure in his field.

Collaborations

Sunaoshi has collaborated with notable colleagues, including Kouichi Kurosawa and Takeshi Sato, contributing to various projects that enhance the capabilities of electron microscopy and related technologies.

Conclusion

Takeshi Sunaoshi's contributions to the field of charged particle beam technology and electron microscopy are significant. His innovative patents reflect his commitment to advancing scientific research and technology.

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