Nirasaki, Japan

Takeshi Kawaji

This inventor holds 3 USPTO granted patents. Top assignee: Tokyo Electron Limited. Active years: 2010-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeshi Kawaji. Retrieved from https://idiyas.com/inventor/takeshi-kawaji

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 33.3

Average Co-Inventor Count = 3.6

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2010-2012

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3 patents (USPTO):Explore Patents

Title: The Innovations of Takeshi Kawaji

Introduction

Takeshi Kawaji is a notable inventor based in Nirasaki, Japan. He has made significant contributions to the field of probe technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and accuracy of electrical inspections in various applications.

Latest Patents

Kawaji's latest patents include a needle trace transfer member and a probe apparatus. The needle trace transfer member is designed to align probes before inspecting the electrical characteristics of a target object. This innovative member is made from a shape memory polymer that can rapidly transition between a glass state and a rubber state, optimizing its performance near the glass transition temperature. The second patent involves a probe card inclination adjusting method, which ensures that the probe card is parallel to the mounting surface of a movable table. This method enhances the accuracy of inspections by detecting and adjusting the inclination of the probe card based on the average tip heights of multiple probes.

Career Highlights

Kawaji is currently employed at Tokyo Electron Limited, a leading company in the semiconductor industry. His work has been instrumental in developing advanced technologies that improve the precision of electrical inspections. His innovative approaches have garnered attention and respect within the industry.

Collaborations

Kawaji has collaborated with notable colleagues such as Hiroshi Yamada and Tetsuji Watanabe. Their combined expertise has contributed to the successful development of various technologies in the field.

Conclusion

Takeshi Kawaji's contributions to probe technology and electrical inspection methods highlight his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving accuracy and efficiency in technology applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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