Mito, Japan

Takashi Gunji

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2010-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Gunji. Retrieved from https://idiyas.com/inventor/takashi-gunji

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 4 

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2010-2013

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4 patents (USPTO):Explore Patents

Title: Takashi Gunji: Innovator in Sample Conveying Mechanisms and Charged Particle Beam Systems

Introduction

Takashi Gunji is a prominent inventor based in Mito, Japan. He has made significant contributions to the field of technology, particularly in the development of mechanisms that enhance the handling and measurement of sensitive samples, such as photomasks. With a total of 4 patents to his name, Gunji's work is recognized for its innovation and practical applications.

Latest Patents

One of Gunji's latest patents is a sample conveying mechanism designed to minimize the risk of damage to samples, particularly photomasks. This mechanism features a sample retention system that holds the sample in a suspended position, ensuring that the pattern surface remains separated from any projection sections that could cause contact and potential damage. Another notable patent is a method for measuring electric potential distribution on a sample's surface, which is part of a charged particle beam system. This system allows for high-accuracy measurements even when the back surface of the sample is charged. It can measure the electric potential distribution during the transportation of the sample and adjust the charge neutralization based on the measurements obtained.

Career Highlights

Gunji is currently employed at Hitachi High-Technologies Corporation, where he continues to innovate and develop advanced technologies. His work has significantly impacted the field of semiconductor manufacturing and inspection, providing solutions that enhance the accuracy and efficiency of processes involving delicate samples.

Collaborations

Throughout his career, Gunji has collaborated with notable colleagues, including Katsuya Kawakami and Hidetoshi Sato. These collaborations have fostered an environment of innovation and have contributed to the successful development of various technologies.

Conclusion

In summary, Takashi Gunji is a distinguished inventor whose work in sample conveying mechanisms and charged particle beam systems has advanced the field of technology. His contributions continue to influence the industry, showcasing the importance of innovation in handling sensitive materials.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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