The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Jul. 29, 2009
Applicants:

Katsuya Kawakami, Mito, JP;

Masahiro Tsunoda, Hitachinaka, JP;

Takashi Gunji, Mito, JP;

Hidetoshi Sato, Hitachinaka, JP;

Inventors:

Katsuya Kawakami, Mito, JP;

Masahiro Tsunoda, Hitachinaka, JP;

Takashi Gunji, Mito, JP;

Hidetoshi Sato, Hitachinaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 15/10 (2006.01); H01L 21/677 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample conveying mechanism minimizes a risk of damage to a sample typified particularly by a photomask, and the sample conveying mechanism provides the sample retention mechanism for holding the sample so as to be suspended and is configured such that a portion close to a pattern surface of the sample is separated from a projection section of a flange for suspending the sample, thereby inhibiting a contact between the pattern surface and members configuring the conveying mechanism.


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