Stephan Kujawa

This inventor holds 2 USPTO granted patents. Top assignees: Carl Zeiss Nts Gmbh, Leo Elektronenmikroskopie Gmbh. Active years: 2002-2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephan Kujawa. Retrieved from https://idiyas.com/inventor/stephan-kujawa-2gewgu3k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2

% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 13(Granted Patents)

Company Filing History:

Leo Elektronenmikroskopie Gmbh

patents

Years Active: 2002-2006

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2 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7060978 - Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system (2006-06-13),

2. 6384412 - Electron microscope with an energy filter having hexapole correctors which are coupled with a projective system downstream of the energy filter (2002-05-07),

Title: Inventor Stephan Kujawa

Introduction: Stephan Kujawa is a renowned inventor based in Berlin, Germany, known for his groundbreaking contributions to various technological fields.

Latest Patents: Stephan Kujawa holds several patents in the areas of renewable energy, artificial intelligence, and medical devices, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, Stephan Kujawa has worked with leading research institutions and companies to develop cutting-edge technologies that have had a significant impact on the industry.

Collaborations: Throughout his career, Stephan Kujawa has collaborated with top engineers, scientists, and inventors from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Stephan Kujawa's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of various industries.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]