Company Filing History:
5 out of 138 
2 out of 122 
2 out of 4,197 
Years Active: 1977-2000
Title: Stanley J Kishner: A Pioneer in Optical Metrology
Introduction:
Stanley J Kishner, a distinguished inventor based in Pomona, NY, has made significant contributions to the field of inventions with his revolutionary ideas and innovative solutions. His relentless pursuit of excellence has earned him a reputation as a beacon of innovation in the realm of optical metrology and focal plane arrays of detectors.
Latest Patents:
One of Stanley J Kishner's latest patents includes a groundbreaking 'System and Method for Converting an Incoming Image into Electronic Form.' This system involves a unique surface with varying reflectance regions, focal plane arrays of detectors, and an image combining algorithm. It effectively combines different portions of an incoming image without any dead pixel regions, showcasing Kishner's expertise in the field.
Another notable patent by Kishner is the 'Sample Point Interferometer for Measuring Changes in Figure of a Primary Mirror.' This optical metrology method and apparatus facilitate the simultaneous measurement of changes in the figure of a primary mirror and spacing between the primary mirror and a secondary mirror, showcasing his versatility and proficiency in diverse technological domains.
Career Highlights:
Stanley J Kishner has a rich professional background, with a notable stint at Kollmorgen Technologies Corporation and Kollmorgen Corporation. His expertise and dedication have played a pivotal role in shaping the innovations within these esteemed organizations, reflecting his knack for pushing the boundaries of technological advancements.
Collaborations:
Throughout his illustrious career, Stanley J Kishner has collaborated with various talented individuals, including esteemed coworkers like David Zelmanovic and Ernest D Park. These collaborations have not only enriched his innovative pursuits but have also led to the development of groundbreaking technologies in the field of optical metrology.
Conclusion:
In conclusion, Stanley J Kishner stands tall as a trailblazer in the world of inventions, particularly in optical metrology and focal plane arrays of detectors. His unwavering commitment to innovation and his knack for translating ideas into tangible solutions continue to inspire inventors and innovators worldwide, cementing his legacy as a visionary in the realm of technological advancements.