The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 1977

Filed:

Mar. 23, 1976
Applicant:
Inventor:

Stanley J Kishner, Pomona, NY (US);

Assignee:

Kollmorgen Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356210 ;
Abstract

A reflectometer optical system having an optical axis for illuminating a sample with flux derived from an extended source such as a pulsed xenon flashtube. A wedge-shaped diffuser, symmetric with respect to the optical axis, is used to diffuse the flux emanating from the source and refract it radially outward from the optical axis. The polished inner surface of a cylinder is used to reflect these radially expanding rays such that they converge upon the sample area from all azimuth angles. A series of baffles are located between the diffuser and the sample to limit the flux incident upon the sample to a small angular spread about 45.degree.. A lens located along the optical axis focuses the flux diffusely reflected from the sample onto one end of a fiber optical bundle. An aperture stop disposed between the lens and the sample limits the reflected flux to a small angular spread about 0.degree. while the end of the fiber optic bundle serves as a field stop to limit the region of the sample from which reflcted light is collected.


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