The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 1995
Filed:
May. 20, 1994
Stanley J Kishner, Pomona, NY (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
Optical metrology method and apparatus for simultaneously measuring changes in figure of a primary mirror and spacing between the primary mirror (58) and a secondary mirror (54). One or more optical heads (62A, 62B, 62C) are attached to structure (66) supporting the secondary mirror (54) and adjacent thereto. Each optical head (62A, 62B, 62C) provides a laser generated output beam. By interferometry and electronics, output signals are generated which indicate the changes in figure of the primary mirror (58) and the spacing between the primary mirror (58) and the secondary mirror (54).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile