The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 1986
Filed:
Sep. 24, 1984
Applicant:
Inventors:
David Zelmanovic, Monsey, NY (US);
Stanley J Kishner, Pomona, NY (US);
Assignee:
Kollmorgen Technologies Corporation, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250339 ; 250340 ; 250341 ;
Abstract
In the manufacture of a multilayer polymer film, the thickness and degree of orientation are simultaneously measured. A beam of infrared radiation having predetermined wavelengths is either transmitted through or reflected by the polymer film to be measured and received by a photodetector. The photodetector provides an electrical output signal which can be analyzed to determine the thickness and degree of orientation.