IDiyas

For the Inventor, By the Inventor

Utsunomiya, Japan

Shinichiro Koga

USPTO Granted Patents = 23 

Average Co-Inventor Count = 1.9

ph-index = 8

Forward Citations = 295(Granted Patents)


Location History:

  • Kawasaki, JP (1998 - 2001)
  • Utsunomiya, JP (1998 - 2023)

Company Filing History:

goldMedal23 out of 90,594 
 
Canon Kabushiki Kaisha
 patents

Years Active: 1998-2024

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23 patents (USPTO):Explore Patents
1. 12148181 - Measurement apparatus that measures position information of measurement target in predetermined direction (2024-11-19),
2. 11721013 - Information processing apparatus, determination method, imprint apparatus, lithography system, article manufacturing method, and non-transitory computer-readable storage medium (2023-08-08),
3. 11061335 - Information processing apparatus, storage medium, lithography apparatus, lithography system, and article manufacturing method (2021-07-13),
4. 10996574 - Substrate processing apparatus, article manufacturing method, substrate processing method, substrate processing system, management apparatus, and storage medium (2021-05-04),
5. 9880475 - Lithography apparatus, lithography method, lithography system, storage medium, and article manufacturing method (2018-01-30),
6. 9423700 - Lithography apparatus, lithography method, lithography system, storage medium, and article manufacturing method (2016-08-23),
7. 9261802 - Lithography apparatus, alignment method, and method of manufacturing article (2016-02-16),
8. 8384900 - Exposure apparatus (2013-02-26),
9. 8305555 - Exposure apparatus, exposure method, and device manufacturing method (2012-11-06),
10. 7990519 - Exposure apparatus and device manufacturing method (2011-08-02),
11. 7477390 - Exposure method and apparatus, and device manufacturing method (2009-01-13),
12. 7315348 - Exposure apparatus, focal point detecting method, exposure method and device manufacturing method (2008-01-01),
13. 6661838 - Image processing apparatus for detecting changes of an image signal and image processing method therefor (2003-12-09),
14. 6556711 - Image processing apparatus and method (2003-04-29),
15. 6538260 - Position measuring method, and semiconductor device manufacturing method and apparatus using the same (2003-03-25),

Title: Innovations by Shinichiro Koga: A Glimpse into His Patents and Contributions

Introduction: Shinichiro Koga, based in Utsunomiya, Japan, is a prominent inventor with a remarkable portfolio of 23 patents. He is known for his pioneering work in measurement and information processing apparatuses, which has significantly impacted the fields of technology and manufacturing.

Latest Patents: Among his most recent patents is a measurement apparatus designed to accurately measure the position information of a measurement target in a predetermined direction. This apparatus utilizes a scope to capture images and generates data which aids in determining the target’s position. Additionally, Koga has developed an information processing apparatus for identifying formation defects in patterns formed by an imprint process. This innovative apparatus generates learning models for various illumination conditions, enhancing the accuracy of defect detection in manufactured substrates.

Career Highlights: As part of his career, Koga has made significant contributions to Canon Kabushiki Kaisha, a leading company in imaging and printing technologies. His inventive work plays a crucial role in advancing the company's research and development capabilities, particularly in precision measurement and image processing technologies.

Collaborations: Shinichiro Koga collaborates with esteemed colleagues such as Yoshihiro Ishida and Nobuyuki Shigeeda. Their teamwork has fostered an environment of innovation, combining their expertise to drive forward-thinking solutions in their respective fields.

Conclusion: Shinichiro Koga’s contributions through his patents and collaborations reflect his commitment to advancing technology. His ongoing work not only enhances the capabilities of Canon Kabushiki Kaisha but also pushes the boundaries of what's possible in measurement and information processing systems.

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