Enter inventor name

Average Co-Inventor Count = 5.1

ph-index = 14

Forward Citations = 732(Granted Patents)

Location History:

Ibaraki, JP (2011)
Hitachi, JP (1992 - 2015)

Company Filing History:

Hitachi-high-technologies Corporation

patents

1 out of 3,781

Renesas Technology Corp.

patents

Years Active: 1992-2015

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Areas of Expertise:

Foreign Matter Detection

Electron Beam Inspection

Wafer Inspection

Pattern Defect Inspection

Data Processing

Cache Memory

Low Power Semiconductor

Microprocessor Design

Parallel Processing

Integrated Circuit Devices

Pipelined Semiconductor Devices

41 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9164042 - Device for detecting foreign matter and method for detecting foreign matter (2015-10-20),

2. 7999565 - Inspection apparatus and inspection method using electron beam (2011-08-16),

3. 7889911 - Image processing unit for wafer inspection tool (2011-02-15),

4. 7521676 - Method and apparatus for inspecting pattern defects and mirror electron projection type or multi-beam scanning type electron beam apparatus (2009-04-21),

5. 7518383 - Inspection apparatus and inspection method using electron beam (2009-04-14),

6. 7424598 - Data processor (2008-09-09),

7. 7421110 - Image processing unit for wafer inspection tool (2008-09-02),

8. 7240159 - Data processor having cache memory (2007-07-03),

9. 7111187 - Information processor and information processing system utilizing interface for synchronizing clock signal (2006-09-19),

10. 6848027 - Data processor having cache memory (2005-01-25),

11. 6675311 - Data processing system generating clock signal from an input clock, phase locked to the input clock and used for clocking logic devices (2004-01-06),

12. 6671815 - Low power consumption semiconductor integrated circuit device and microprocessor (2003-12-30),

13. 6587927 - Data processor having cache memory (2003-07-01),

14. 6467004 - Pipelined semiconductor devices suitable for ultra large scale integration (2002-10-15),

15. 6275902 - Data processor with variable types of cache memories and a controller for selecting a cache memory to be access (2001-08-14),

Title: Shigeya Tanaka: Pioneer in Innovative Detection Technologies

Introduction

Shigeya Tanaka, an accomplished inventor based in Hitachi, Japan, has made significant contributions to the field of detection technologies with a remarkable portfolio of 41 patents. His innovative approaches focus on enhancing the reliability of various objects, particularly in the realm of electronic components.

Latest Patents

Tanaka's latest patents showcase his ingenuity and problem-solving capabilities. One notable invention is a device for detecting foreign matter, which uses terahertz illumination light to identify contaminants on the surfaces of objects, such as electrode mixtures. This technology improves reliability by detecting metal foreign matter present in the electrode. Another significant patent describes a visual inspection apparatus and method using a scanning electron microscope. This device scans an electron beam over a sample to generate inspection and reference images, allowing for the identification of defects through differential imaging.

Career Highlights

Throughout his illustrious career, Tanaka has worked with notable companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His roles at these institutions have allowed him to develop and refine innovative technologies that address critical challenges in detection and inspection methods.

Collaborations

Shigeya Tanaka has collaborated with esteemed colleagues such as Takashi Hotta and Masahiro Iwamura. Their collective expertise has fostered an environment of creativity and innovation, driving advancements in technologies that benefit various industries.

Conclusion

With a proven track record of innovation and a deep understanding of detection technologies, Shigeya Tanaka continues to make substantial contributions to the field. His work not only enhances product reliability but also sets a high standard for future developments in inspection technologies.

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