The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Feb. 01, 2012
Kenji Aiko, Ninomiya, JP;
Shigeya Tanaka, Hitachi, JP;
Yasuko Aoki, Mito, JP;
Hiroshi Kawaguchi, Hitachinaka, JP;
Kei Shimura, Mito, JP;
Kenji Aiko, Ninomiya, JP;
Shigeya Tanaka, Hitachi, JP;
Yasuko Aoki, Mito, JP;
Hiroshi Kawaguchi, Hitachinaka, JP;
Kei Shimura, Mito, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Abstract
The present invention provides a device for detecting foreign matter and a method for detecting foreign matter to detect a foreign matter on a surface of an object such as a film of an electrode mixture etc. or a foreign matter contained in the object, thereby to improve the reliability of the object. By irradiating an object with a terahertz illumination light(wavelength of 4 μm to 10 mm) and detecting a scattered lightfrom an electrodeas an example of the object by a scattered light detector, a foreign matter on a surface of the electrodeor contained in the electrode, for example, a metal foreign matter, is detected. The electrodeis one in which electrode mixture layerseach including an active material, conductive additive and a binder as components are coated on both surfaces of a collector. The scattered lightresults from a part of a transmitted lightreflected by the metal foreign matter