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Shigeki Takizawa

USPTO Granted Patents = 5

Average Co-Inventor Count = 1.2

ph-index = 1

Forward Citations = 17(Granted Patents)

Location History:

Meiwa-mura, JP (2001)
Tokyo, JP (2008 - 2010)
Saitama, JP (2011)

Company Filing History:

Adv Antest Corporation

Years Active: 2001-2011

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5 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7876118 - Test equipment (2011-01-25),

2. 7802160 - Test apparatus and calibration method (2010-09-21),

3. 7768255 - Interconnection substrate, skew measurement method, and test apparatus (2010-08-03),

4. 7350123 - Test apparatus, correction value managing method, and computer program (2008-03-25),

5. 6275057 - Semiconductor test system having high frequency and low jitter clock generator (2001-08-14),

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