This inventor holds 5 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 2001-2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Meiwa-mura, JP (2001)
- Tokyo, JP (2008 - 2010)
- Saitama, JP (2011)
Company Filing History:
Years Active: 2001-2011
Title: Shigeki Takizawa: Innovator in Test Equipment Technology
Introduction
Shigeki Takizawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of test equipment technology, holding a total of 5 patents. His innovative designs have enhanced the efficiency and accuracy of testing devices.
Latest Patents
Among his latest patents is a test apparatus designed to evaluate a device under test. This apparatus includes a pattern generating section that creates a test pattern, a signal supplying section that delivers a test signal, a trigger generating section that provides a trigger signal to external instruments, and a synchronization control section that outputs a synchronization signal based on the test pattern. Another notable patent is a test apparatus and calibration method that features a driver section for supplying test signals, a judgment section for determining pass/fail outcomes, a voltage measuring section for detecting DC voltage, and an output side adjusting section that modifies the duty ratio of the signal according to the detected voltage.
Career Highlights
Shigeki Takizawa is currently employed at Adv Antest Corporation, where he continues to develop innovative testing solutions. His work has been instrumental in advancing the capabilities of test equipment, making significant impacts in various industries.
Collaborations
He collaborates with talented coworkers, including Toshio Matsuura and Koichi Yatsuka, who contribute to the innovative environment at Adv Antest Corporation.
Conclusion
Shigeki Takizawa's contributions to test equipment technology exemplify his dedication to innovation and excellence. His patents reflect a commitment to improving testing processes, making him a valuable figure in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
