The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Feb. 05, 2009
Satoshi Iwamoto, Saitama, JP;
Shigeki Takizawa, Saitama, JP;
Koichi Yatsuka, Gunma, JP;
Toshio Matsuura, Saitama, JP;
Satoshi Iwamoto, Saitama, JP;
Shigeki Takizawa, Saitama, JP;
Koichi Yatsuka, Gunma, JP;
Toshio Matsuura, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern for testing the device under test; a signal supplying section that supplies the device under test with a test signal corresponding to the test pattern; a trigger generating section that supplies a trigger signal to an external instrument connected to the device under test; and a synchronization control section that outputs, to the trigger generating section, a synchronization signal instructing generation of the trigger signal, based on at least a portion of the test pattern generated by the pattern generating section.