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For the Inventor, By the Inventor

Dallas, TX, United States of America

Shangting Detweiler

This inventor holds 3 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 2008-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shangting Detweiler. Retrieved from https://idiyas.com/inventor/shangting-detweiler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3

% Patents Active = 100.0

Average Co-Inventor Count = 3.3

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:

goldMedal3 out of 29,922 
 
Texas Instruments Corporation
 patents

Years Active: 2008-2012

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3 patents (USPTO):Explore Patents
1. 8273523 - By-die-exposure for patterning of holes in edge die (2012-09-25),
2. 7887875 - Method to reduce photoresist poisoning (2011-02-15),
3. 7374866 - System and method for exposure of partial edge die (2008-05-20),

Title: The Innovative Journey of Shangting Detweiler

Introduction: Shangting Detweiler, a talented inventor based in Dallas, TX, has made significant contributions to the field of technology with his groundbreaking innovations.

Latest Patents: Shangting Detweiler holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise.

Career Highlights: With a background in engineering and a passion for problem-solving, Shangting Detweiler has successfully brought several of his inventions from concept to market, revolutionizing industries along the way.

Collaborations: Throughout his career, Shangting Detweiler has collaborated with leading research institutions, universities, and tech companies to further develop his inventions and bring them to the masses.

Conclusion: Shangting Detweiler's relentless pursuit of innovation and his commitment to pushing the boundaries of what is possible make him a true pioneer in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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