Title: Sergius Janik - Innovator in Analyte Measurement Technology
Introduction: Sergius Janik is an inventor based in Berlin, Germany, known for his contributions to the field of analyte measurement technology. He currently works at Diamontech AG, where he collaborates with fellow innovators Werner Mäntele and Thorsten Lubinski. Although he has not yet been granted any patents, his work is focused on developing advanced methods and apparatuses for analyzing materials containing analytes.
Latest Patent Applications: Sergius Janik has submitted several patent applications that showcase his innovative approach to analyte measurement. One of his latest applications is titled "Method and Apparatus for Analyte Measurement Including Material Status Analysis." This method involves analyzing a material that contains at least one analyte, incorporating a material status analyzing procedure to determine the present status of the material. Based on the results, the method selects analyte-characteristic wavelengths and other parameters for the measurement procedure.
Another significant application is "Apparatus and Method for Analyte Measurement with Improved Coupling of Excitation Radiation into Material Including Said Analyte." This apparatus is designed to analyze materials by utilizing an excitation radiation source and a detection device. The design includes a measurement body with a contact surface that interacts with the material, enhancing the efficiency of the analyte measurement process.
Conclusion: Sergius Janik is an emerging inventor in the field of analyte measurement technology, with a focus on innovative methods and apparatuses. His contributions, although not yet patented, demonstrate a commitment to advancing the science of material analysis.
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