Apparatus and method for analyte measurement with improved detection of the deflection of a detection light beam

Abstract

Disclosed herein is an apparatus () for analyzing a material () comprising at least one analyte, said apparatus () comprising a measurement body () having a contact surface () suitable to be brought in thermal contact or pressure-transmitting contact with said material (), an excitation radiation source configured for irradiating excitation radiation into the material () to be absorbed therein, and a detection light source for generating a detection light beam () travelling through at least a portion of said measurement body () or a component included in said measurement body, wherein said detection light beam is directed to be totally or partially reflected at said contact surface (), wherein said contact surface () of the measurement body is curved in at least one principal direction in the area where the detection light beam () is reflected.