The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

May. 20, 2021
Applicant:

Diamontech Ag, Berlin, DE;

Inventors:

Werner Mäntele, Kiefersfelden-Mühlbach, DE;

Thorsten Lubinski, Berlin, DE;

Sergius Janik, Berlin, DE;

Michael Kaluza, Berlin, DE;

Assignee:

DiaMonTech AG, Berlin, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/00 (2006.01); A61B 5/107 (2006.01); A61B 5/1172 (2016.01); A61B 5/145 (2006.01); A61B 5/1495 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14532 (2013.01); A61B 5/1075 (2013.01); A61B 5/1172 (2013.01); A61B 5/1451 (2013.01); A61B 5/14539 (2013.01); A61B 5/14546 (2013.01); A61B 5/1455 (2013.01); A61B 5/1495 (2013.01); A61B 5/443 (2013.01); A61B 5/7221 (2013.01);
Abstract

A method of analyzing a material () comprising at least one analyte, wherein analyte-wavelength-specific measurements are interspersed with reference measurements (), and wherein response signals obtained for the reference measurements () are used for one or more of calibrating an excitation radiation source () for generating said excitation radiation, calibrating said detection device, recognizing a variation in the measurement conditions by comparing results of individual reference measurements (), adapting the analyte measurement procedure () with respect to one or more of the entire duration thereof, the absolute or relative duration of analyte-wavelength-specific measurements for a given analyte-characteristic-wavelength, or terminating and/or restarting the analyte measurement procedure, and adapting the analysis carried out in the analyzing step.


Find Patent Forward Citations

Quick Actions:

Mäntele, Werner. (2026). Method and apparatus for analyte measurement including real-time quality assessment and improvement (U.S. Patent No. 12778463). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12778463

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…