The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
May. 26, 2021
Diamontech Ag, Berlin, DE;
Werner Mäntele, Kiefersfelden-Mühlbach, DE;
Thorsten Lubinski, Berlin, DE;
Sergius Janik, Berlin, DE;
Michael Kaluza, Berlin, DE;
DiaMonTech AG, Berlin, DE;
Abstract
An apparatus () for analyzing a material () comprising at least one analyte, said apparatus comprising a measurement body () having a contact surface () suitable to be brought in thermal contact or pressure-transmitting contact with said material (), an excitation radiation source () configured for irradiating excitation radiation () into the material () to be absorbed therein, and a detection device for detecting a physical response of the measurement body to heat or a pressure wave received from said material () upon absorption of said excitation radiation () and for generating a response signal indicative of the degree of absorption of excitation radiation, wherein a protrusion () is provided, said protrusion having a front surface () facing said material () and being in contact with the material when the material is brought in contact with the contact surface, and wherein said excitation radiation () is irradiated into the material () through said front surface () of said protrusion (), wherein said protrusion () is formed on said contact surface () of said measurement body (), or wherein said measurement body () forms said protrusion or a part of said protrusion, in which said contact surface () of said measurement body () forms at least a part of said front surface of said protrusion and is elevated with respect to a surrounding structure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile