This inventor holds 4 USPTO granted patents. Top assignee: Anritsu Corporation. Active years: 2004-2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Atsugi, JP (2004 - 2013)
- Kanagawa, JP (2019)
Company Filing History:
Years Active: 2004-2019
Title: Seiya Suzuki: Inventor in Measurement Technology
Introduction
Seiya Suzuki is an inventor based in Atsugi, Japan, whose work includes technologies for sampling signals and measuring jitter transfer characteristics. He is associated with Anritsu Corporation and is credited with 4 patents.
Latest Patents
One of Suzuki’s latest patents concerns a sampling circuit, sampling method, sampling oscilloscope, and waveform display method. The invention uses a frequency synthesizer and multiple sampler units to collect measurements of a signal and related I and Q signals. A correction-value calculation unit uses the sampled data and the set sampling time to calculate a timing correction.
Another patent describes an apparatus for measuring jitter transfer characteristics. It applies a modulation signal containing sinusoidal components at different frequencies to a clock signal, then measures the resulting signal after it passes through a device under test. The apparatus detects the amplitudes of the components and calculates ratios between measured and known amplitudes, enabling rapid characterization of jitter transfer.
Career Highlights
Suzuki’s patent work focuses on electronic measurement and signal analysis. The described inventions address sampling accuracy and efficient evaluation of jitter behavior, both relevant to testing communication and electronic systems.
Collaborations
Suzuki is associated with Anritsu Corporation. Ken Mochizuki and Takashi Murakami are identified as some of his coworkers.
Conclusion
Seiya Suzuki’s patents reflect a focus on practical measurement technologies, including precise waveform sampling and faster analysis of jitter transfer characteristics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
